Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)
Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)
Paid


SERVICE DESCRIPTION | ----

  • Laboratorium Fisika dan Instrumen Pencitraan Maju - EM dan Spektroskopi (Non Mitra)
  • KST Serpong (Bacharuddin Jusuf Habibie)
    Gedung 440-442, KST. BJ. Habibie Serpong, Tangerang Selatan, 15314
  • 08119811578
  • labkarserpong@brin.go.id
  • Service Unit: Per Sample
  • Service Duration: 14 Working Days
  • Service Quota Per Day: 1
  • Service Capacity: 1 Per Sample
  • Minimum Amount: 1
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Application Requirements:
  • Photo
  • Other Supporting File
File Name File Size
Service SOP/Form file 0.24 MB
Template Photo 0 MB
Template Other Supporting File 0 MB

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