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Field Emission Scanning Electron Microscopes (FE-SEM) Thermo Apreo 2 Field Emission Scanning Electron Microscopes (FE-SEM) Thermo Apreo 2
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Advanced FE-SEM Characterization with an additional 1 EDS feature (point/line/mapping) services Advanced FE-SEM Characterization with an additional 1 EDS feature (point/line/mapping) services
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Advanced FE-SEM Characterization with additional 2 EDS features (point & line, point & map, line & map) Advanced FE-SEM Characterization with additional 2 EDS features (point & line, point & map, line & map)
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Advanced FE-SEM Characterization with additional 4 EDS features (point, line, and mapping) services Advanced FE-SEM Characterization with additional 4 EDS features (point, line, and mapping) services
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X-ray Diffraction / XRD Analysis (Aeris Panalytical ) X-ray Diffraction / XRD Analysis (Aeris Panalytical )
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Fouier-Transform Infrared Spectrometer (FTIR) Analysis Fouier-Transform Infrared Spectrometer (FTIR) Analysis
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Fouier-Transform Infrared Spectrometer (FTIR) Analysis
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Particle Size Analyzer (PSA) - Micro Analysis Particle Size Analyzer (PSA) - Micro Analysis
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Particle Size Analyzer (PSA) - Micro Analysis
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Thermal Conductivity Analyzer Thermal Conductivity Analyzer
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Transmission Electron Microscopy (TEM) Transmission Electron Microscopy (TEM)
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X-Ray Fluorescence (XRF) Analysis - Hitachi X-Ray Fluorescence (XRF) Analysis - Hitachi
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Brunauer Emmett Teller (BET) (surface area + pore size distribution) Analysis Brunauer Emmett Teller (BET) (surface area + pore size distribution) Analysis
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