Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)
Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)
Rp 2.500.000


SERVICE DESCRIPTION | ----

  • Lab Karakterisasi Nuklir - Sub Laboratorium Bahan Maju Nuklir
  • KST Serpong (Bacharuddin Jusuf Habibie)
    Gd. 71 KST BJ Habibie, Kel. Muncul, Kec. Setu, Kota Tangerang Selatan 15314
  • 08119811572
  • labrads@brin.go.id
  • Service Unit: Per Sample
  • Service Duration: 14 Working Days
  • Service Quota Per Day: 1
  • Service Capacity: 1 Per Sample
  • Minimum Amount: 1
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Application Requirements:
  • Photo
  • Other Supporting File
File Name File Size
Service SOP file 0.24 MB
Template Photo 0 MB
Template Other Supporting File 0 MB

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