Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)
Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)
Rp 500.000


SERVICE DESCRIPTION | Atomic Force Microscope is a type of microscope with a very high resolution whose resolution reaches a fraction of a nanometer, 1000 times stronger than the optical diffraction limit. Atomic force microscope precursor microscope, developed by Gerd Binnig…

  • Lab Nuklir Serpong - Sub Laboratorium Bahan Maju Nuklir
  • Puspiptek - Serpong
    Gd. 71 KST BJ Habibie, Kel. Muncul, Kec. Setu, Kota Tangerang Selatan 15314
  • 08119811572
  • labrads@brin.go.id
  • Service Unit: per scan size
  • Service Duration: 1 Working Days
  • Service Quota Per Day: 1
  • Service Capacity: 1 per scan size
  • Minimum Amount: 1
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Atomic Force Microscope is a type of microscope with a very high resolution whose resolution reaches a fraction of a nanometer, 1000 times stronger than the optical diffraction limit. Atomic force microscope precursor microscope, developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at the IBM research center

Application Requirements:
  • Photo
  • Other Supporting File
File Name File Size
Service SOP file 0.19 MB
Template Photo 0 MB
Template Other Supporting File 0 MB

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