X-ray Diffraction / XRD
Analysis (Aeris Panalytical )

For using the X-ray diffraction (XRD) PANalytical AERIS (Cu-Source) unit, please take note of the following :

1. Service Request: Before clicking "Request a Service," please check the available schedule.

2. Sample Verification: To facilitate verification of registered test samples, customers must complete Form F-10. This form can be downloaded from the "Service Files" section by selecting "Service SOP Files." The completed Form F-10 in PDF format should be uploaded along with sample photos in the "Other Supporting Files" and "Photo Data Files" sections.

3. Sample Consistency: Ensure that the NAME and NUMBER OF SAMPLES registered with ELSA match the NUMBER OF SAMPLES listed on Form F-10.

4. Document Completeness: Incomplete supporting documents may result in the cancellation of the test sample registration by the Laboratory Management.

5. Refund Policy: Refunds are only provided in case of technical problems at the Laboratory.

6. Sample Collection: If the sample needs to be collected again, the maximum time limit for collection is 1 month (30 working days) after the test has been completed.

Please ensure all procedures and documentation are followed correctly to avoid any disruptions in your testing process.

Additional Information:

A. For customers using X-ray diffraction (XRD) testing, the results will be provided as XRD patterns and raw data detailing the theta angle and intensity.

B. The XRD analysis software options include :

• Rigaku: PDXL
• PANalytical: HighScore
• Bruker: Laptos, Topas, DiffracEva

• Photo
• Other Supporting File