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SERVICE DESCRIPTION | A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain…
- Laboratorium Karakterisasi Lanjut - Serpong (Metalurgi)
- Puspiptek - Serpong
Gedung 224 dan gedung 225 Kawasan Sains dan Teknologi BJ. Habibie (PUSPIPTEK) Serpong, 15314, Tangerang Selatan, Banten – Indonesia - 08119811569
- labmaterialmetalurgi@brin.go.id
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A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. SEM can achieve resolution better than 1 nanometer. Specimens are observed in high vacuum in conventional SEM, or in low vacuum or wet conditions in variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments.[1]
E-mail layanan uji: labkarserpong@brin.go.id
Application Requirements:
E-mail layanan uji: labkarserpong@brin.go.id
Application Requirements:
- Photo
- Other Supporting File
| File Name | File Size | |
|---|---|---|
| Service SOP file | 0.12 MB | |
| Template Photo | 0 MB | |
| Template Other Supporting File | 0 MB |
