EDS (point, line, and
mapping)

Unit: Scanning Electron Microscope (SEM)
Brand/Type: Hitachi SU-3500 and Jeol JSM-IT200

Advanced Characterization Additional EDS features (point, line, & mapping) are only for additional EDS test features.
If the customer at the time of assistance wants to add element analysis with EDS and wasn't previously registered when registering for Morphological Analysis only
Please select "Scanning Electron Microscope (SEM) Analysis Services".

Notes:

1. Before clicking Request a Service, please see the available SCHEDULE first.

2. To facilitate verification of registered test samples, customers must complete Form F-10 which can be downloaded in the "Service Files" section then select "Service SOP Files". Form F-10 that has been filled in. PDF format is uploaded along with Sample Photos in the "Other Supporting Files" and "Photo Data Files" sections.

3. Make sure that the NAME and NUMBER OF SAMPLES registered with ELSA are the same as the NUMBER OF SAMPLES written on Form F-10.

4. Incompleteness of these supporting documents may cause the test sample registration to be canceled by the Laboratory Management.

5. Refunds cannot be made unless there are technical problems at the Laboratory.

6. If the sample will be taken again. The maximum time limit for sampling is 1 month (30 working days) after the test has been completed.

• Photo
• Other Supporting File