Film Thickness Measurement
Film Thickness Measurement
Rp 500.000


SERVICE DESCRIPTION | The Dektak Profiler is a precision metrology tool used to measure surface profiles, thin layer thickness and material roughness on the nanometer to micrometer scale.

  • Lab Karakterisasi Nuklir - Sub Laboratorium Bahan Maju Nuklir
  • KST Serpong (Bacharuddin Jusuf Habibie)
    Gd. 71 KST BJ Habibie, Kel. Muncul, Kec. Setu, Kota Tangerang Selatan 15314
  • 08119811572
  • labrads@brin.go.id
  • Service Unit: Service
  • Service Duration: 14 Working Days
  • Service Quota Per Day: 5
  • Service Capacity: 5 Service
  • Minimum Amount: 1
Marketing Office
Deputi Bidang Infrastruktur Riset dan Inovasi BRIN
layanan_sains@brin.go.id
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The Dektak Profiler is a precision metrology tool used to measure surface profiles, thin layer thickness and material roughness on the nanometer to micrometer scale.

Application Requirements:
  • Photo
  • Other Supporting File
File Name File Size
Service SOP file 0.18 MB
Template Photo 0 MB
Template Other Supporting File 0 MB

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