Film thickness measurement
Film thickness measurement
Rp 200.000


SERVICE DESCRIPTION | The Bruker Dektak XT contact profilometer measures the thin film thickness of patterned features by sensing the deflection of a fine stylus that is raster scanning over features ranging in height from 1 mm down to 5 nm. It is capable of mapping step…

  • Laboratorium KST Samaun Samadikun - Sub Laboratorium
  • Bandung - Cisitu
    Gedung Basics Tower 2 Lantai 1, BRIN Bandung KST Samaun Samadikun. Jalan Sangkuriang 1-9, Kecamatan Coblong, Kota Bandung
  • 089528898492
  • lab.karakteristikcisitu@gmail.com
  • Service Unit: per sample
  • Service Duration: 5 Working Days
  • Service Quota Per Day: 5
  • Service Capacity: 5 per sample
  • Minimum Amount: 1
Marketing Office
Deputi Bidang Infrastruktur Riset dan Inovasi BRIN
layanan_sains@brin.go.id
Apply for Service
The Bruker Dektak XT contact profilometer measures the thin film thickness of patterned features by sensing the deflection of a fine stylus that is raster scanning over features ranging in height from 1 mm down to 5 nm. It is capable of mapping step heights and displaying topological three dimensional images of substrates ranging from 200 mm diameter wafers down to small pieces.

Application Requirements:
  • Photo
  • Other Supporting File

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