Rp 200.000
SERVICE DESCRIPTION | The Bruker Dektak XT contact profilometer measures the thin film thickness of patterned features by sensing the deflection of a fine stylus that is raster scanning over features ranging in height from 1 mm down to 5 nm. It is capable of mapping step…
- Laboratorium KST Samaun Samadikun - Sub Laboratorium
- Bandung - Cisitu
Gedung Basics Tower 2 Lantai 1, BRIN Bandung KST Samaun Samadikun. Jalan Sangkuriang 1-9, Kecamatan Coblong, Kota Bandung - 089528898492
- lab.karakteristikcisitu@gmail.com
Marketing Office
Deputi Bidang Infrastruktur Riset dan Inovasi BRIN
layanan_sains@brin.go.id
The Bruker Dektak XT contact profilometer measures the thin film thickness of patterned features by sensing the deflection of a fine stylus that is raster scanning over features ranging in height from 1 mm down to 5 nm. It is capable of mapping step heights and displaying topological three dimensional images of substrates ranging from 200 mm diameter wafers down to small pieces.
Application Requirements:
Application Requirements:
- Photo
- Other Supporting File
| File Name | File Size | |
|---|---|---|
| Service SOP file | 0.88 MB | |
| Template Photo | 0 MB | |
| Template Other Supporting File | 0 MB |
