Rp 600.000
SERVICE DESCRIPTION | Analysis per solid sample (photomicrograph SEM parameter) s an instrument to find out information about: 1. Topography, namely the surface characteristics and texture (hardness, the nature of reflecting light, and so on). 2. Morphology, namely the shape…
- Lab KST Samaun Samadikun - Lab Karakterisasi
- KST Cisitu (Samaun Samadikun)
Jl. Sangkuriang, Dago, Kecamatan Coblong, Kota Bandung, Jawa Barat BRIN KST Samaun Samadikun - 089528898492
- lab.karakteristikcisitu@gmail.com
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Deputi Bidang Infrastruktur Riset dan Inovasi BRIN
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Analysis per solid sample (photomicrograph SEM parameter)
s an instrument to find out information about:
1. Topography, namely the surface characteristics and texture (hardness, the nature of reflecting light, and so on).
2. Morphology, namely the shape and size of the constituent particles of objects (strength, defects in the Integrated Circuit (IC) and chips, and so on).
3. Composition, i.e. quantitative data of elements and compounds contained in objects (melting point, reactivity, hardness, and so on).
4. Crystallographic information, namely information about how the arrangement of the grains in the object being observed (conductivity, electrical properties, strength, and so on). Is an instrument to characterize the crystal structure, crystal size of a solid material. All materials that contain certain crystals when analyzed using XRD will bring up specific peaks
Application Requirements:
s an instrument to find out information about:
1. Topography, namely the surface characteristics and texture (hardness, the nature of reflecting light, and so on).
2. Morphology, namely the shape and size of the constituent particles of objects (strength, defects in the Integrated Circuit (IC) and chips, and so on).
3. Composition, i.e. quantitative data of elements and compounds contained in objects (melting point, reactivity, hardness, and so on).
4. Crystallographic information, namely information about how the arrangement of the grains in the object being observed (conductivity, electrical properties, strength, and so on). Is an instrument to characterize the crystal structure, crystal size of a solid material. All materials that contain certain crystals when analyzed using XRD will bring up specific peaks
Application Requirements:
- Photo
- Other Supporting File
| File Name | File Size | |
|---|---|---|
| Service SOP/Form file | 0.17 MB | |
| Template Photo | 0 MB | |
| Template Other Supporting File | 0 MB |
