Cryo-FIB - Lamella Milling (Aquilos 2). Cryo-EM Laboratory Cryo-FIB - Lamella Milling (Aquilos 2). Cryo-EM Laboratory
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Cryo-FIB - Lamella Milling (Aquilos 2). Cryo-EM Laboratory
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Single Particle Analysis (SPA) Krios G4 300 kV Single Particle Analysis (SPA) Krios G4 300 kV
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Single Particle Analysis (SPA) Krios G4 300 kV
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Cryo-Electron Tomography (Cryo-ET) using Krios G4 Cryo-Electron Tomography (Cryo-ET) using Krios G4
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Cryo-Electron Tomography (Cryo-ET) using Krios G4
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Cryo FE-SEM (Aquilos 2)- Cryo EM Laboratory Cryo FE-SEM (Aquilos 2)- Cryo EM Laboratory
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Cryo FE-SEM (Aquilos 2)- Cryo EM Laboratory
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Micro-CT Scan Micro-CT Scan
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Micro-CT Scan
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STEM EDS (Talos F200C G2) STEM EDS (Talos F200C G2)
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STEM EDS (Talos F200C G2)
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HRTEM (Talos F200C G2) HRTEM (Talos F200C G2)
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HRTEM (Talos F200C G2)
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ULTRAMICROTOME_TEM Lamella Preparation ULTRAMICROTOME_TEM Lamella Preparation
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ULTRAMICROTOME_TEM Lamella Preparation
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ANALYSIS SERVICES - Scanning Electron Microscope (SEM) ANALYSIS SERVICES - Scanning Electron Microscope (SEM)
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ANALYSIS SERVICES - Scanning Electron Microscope (SEM)
Rp. 600.000
FE SEM (Field Emission Scanning Electron Microscope) FE SEM (Field Emission Scanning Electron Microscope)
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FE SEM (Field Emission Scanning Electron Microscope)
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FE-SEM Quattro S Testing with EDS Features (Mapping/Point/Line) FE-SEM Quattro S Testing with EDS Features (Mapping/Point/Line)
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FE-SEM Quattro S Testing with EDS Features (Mapping/Point/Line)
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Advanced Characterization Using Scanning Electron Microscope (SEM Testing + Wet Preparation + Coating + EDS) Advanced Characterization Using Scanning Electron Microscope (SEM Testing + Wet Preparation + Coating + EDS)
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Advanced Characterization Using Scanning Electron Microscope…
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