X-ray Diffraction / XRD Analysis (Aeris Panalytical ) X-ray Diffraction / XRD Analysis (Aeris Panalytical )
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X-Ray Diffraction (XRD) (SMARTLAB RIGAKU) X-Ray Diffraction (XRD) (SMARTLAB RIGAKU)
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Fouier-Transform Infrared Spectrometer (FTIR) Analysis Fouier-Transform Infrared Spectrometer (FTIR) Analysis
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Particle Size Analyzer (PSA) - Micro Analysis Particle Size Analyzer (PSA) - Micro Analysis
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Particle Size Analyzer (PSA) - Micro Analysis
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Thermal Conductivity Analyzer Thermal Conductivity Analyzer
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Thermal Conductivity Analyzer
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Transmission Electron Microscopy (TEM) Transmission Electron Microscopy (TEM)
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X-Ray Fluorescence (XRF) Analysis - Hitachi X-Ray Fluorescence (XRF) Analysis - Hitachi
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Brunauer Emmett Teller (BET) (surface area + pore size distribution) Analysis Brunauer Emmett Teller (BET) (surface area + pore size distribution) Analysis
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Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C) Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C)
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Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1500 °C (min 30 °C, maks 1500 °C) Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1500 °C (min 30 °C, maks 1500 °C)
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Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 500 °C (min 30 °C, maks 500 °C) Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 500 °C (min 30 °C, maks 500 °C)
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Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C) Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C)
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Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room…
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