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X-Ray Fluorescence (XRF) Analysis - Hitachi X-Ray Fluorescence (XRF) Analysis - Hitachi
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Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C) Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C)
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Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1500 °C (min 30 °C, maks 1500 °C) Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 1500 °C (min 30 °C, maks 1500 °C)
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Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 500 °C (min 30 °C, maks 500 °C) Karakterisasi Lanjut Coeficient Thermal Expansion (Dilatometer) - Room Temperature - 500 °C (min 30 °C, maks 500 °C)
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Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C) Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 1000 °C (min 30 °C, maks 1000 °C)
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Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 200 °C (min 30 °C, maks 200 °C) Karakterisasi Lanjut Light Flash Apparatus (LFA) - Room Temperature - 200 °C (min 30 °C, maks 200 °C)
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Advanced Characterization of Morfology and EBSD Advanced Characterization of Morfology and EBSD
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Advance SEM Characterization with 1 EDS features (Point, Line, or Mapping) Advance SEM Characterization with 1 EDS features (Point, Line, or Mapping)
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Advance SEM Characterization with 2 EDS Features (point & line, point & map, line & map) Advance SEM Characterization with 2 EDS Features (point & line, point & map, line & map)
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